Cart (Loading....) | Create Account
Close category search window
 

On-die droop detector for analog sensing of power supply noise

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Muhtaroglu, A. ; Intel Corp., Hillsboro, OR, USA ; Taylor, G. ; Rahal-Arabi, T.

Understanding the supply fluctuations of various frequency harmonics is essential to maximizing microprocessor performance. Conventional methods used for analog validation of the power delivery system fall short in one or more of the following areas. 1) Measurement accuracy in both frequency and time domains, especially for very high-frequency noise caused by large di/dt events. The multigigahertz power supply noise attenuates very quickly away from the die. Conventional approaches of measuring the noise at the pins of the package or at the die using capacitive probes are not accurate for multigigahertz clocks. For this reason, the observability of high-frequency on-die noise has been very tricky. 2) Implementation (e.g., delivery) of analog references to multiple areas across a "noisy" die, compactness/modularity of the measurement units, restraining assumptions inherent in the measurement circuit such as periodicity of the supply noise event. 3) Automation to enable a timely volume of measurements. The efficiency of the measurements is key to correlating a particular speed path to poser supply noise. To address these issues, this paper presents an on-die droop detector (ODDD), a scalable IC solution implemented and validated on a 90-nm process, for analog sensing of differential high-bandwidth supply noise.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:39 ,  Issue: 4 )

Date of Publication:

April 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.