Cart (Loading....) | Create Account
Close category search window
 

Safety property verification using sequential SAT and bounded model checking

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Parthasarathy, G. ; California Univ., Santa Barbara, CA, USA ; Iyer, M.K. ; Cheng, K.-T. ; Wang, L.-C.

Model checkers verify properties of safety- or business-critical systems. The main idea behind model checking is to convert a design's verification into a problem of checking key design properties expressed as a set of temporal logic formulas. The graph representing the design's state space then becomes the basis for testing these formulas' satisfiability (SAT). This divide-and-conquer approach provides an overall test for design correctness. We describe a method for checking safety properties using sequential SAT. SSAT can efficiently prove true properties by harnessing the power of bounded model checking (BMC) using SAT, but without the need for a pre-computed correctness threshold. Using a standard set of benchmarks, we conducted experiments to compare the runtime behavior of SSAT with BMC and binary decision diagrams (BDDs).

Published in:

Design & Test of Computers, IEEE  (Volume:21 ,  Issue: 2 )

Date of Publication:

Mar-Apr 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.