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Key aspects on ESD protection design for ICs: mixed-mode simulation and RF/mixed-signal ESD

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7 Author(s)
Wang, A. ; Dept. of ECE, Illinois Inst. of Technol., Chicago, IL, USA ; Feng, H. ; Chen, G. ; Zhan, R.
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This paper reviews the key aspects in on-chip ESD (electrostatic discharge) protection circuitry design. The mixed-mode ESD simulation-design methodology is discussed to address the design prediction task. New challenges in ESD protection design for RF/mixed-signal ICs are discussed that include the complex ESD-circuit interactions. RF ESD protection characterization and full-chip ESD protection solutions.

Published in:

ASIC, 2003. Proceedings. 5th International Conference on  (Volume:2 )

Date of Conference:

21-24 Oct. 2003