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Built-in self-testing of VLSI circuits-getting errors to catch themselves

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1 Author(s)
Das, S.R. ; Dept. of Electr. Eng., Ottawa Univ., Ont., Canada

Built in-self-testing (BIST), a technique that generates test patterns and evaluates output responses inside the chip, is discussed. The generation of test patterns, which can be either exhaustive or random, is examined. Methods for output response evaluation are described. Implementation schemes and test evaluation are addressed.<>

Published in:

Potentials, IEEE  (Volume:10 ,  Issue: 3 )