Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

Fault injection into SRAM-based FPGAs for the analysis of SEU effects

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Asadi, G. ; Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran, Iran ; Miremadi, S.G. ; Zarandi, H.R. ; Ejlali, A.

SRAM-based FPGAs are currently utilized in applications such as industrial and space applications where high availability and reliability and low cost are important constraints. The technology of such devices is sensible to Single Event Upsets (SEUs) that may be originated mainly from heavy ion radiation. This paper presents a fault injection method that is based on emulated SEU on the configuration bitstream file of commercial SRAM-based FPGA devices to study the error propagation in these devices. To demonstrate the method, an Altera FPGA, i.e. the Flex10K200, and the ITC'99 benchmark circuits are used. A fault injection tool is developed to inject emulated SEU faults into the circuits. The results show that between 33 to 45 percent of the SEUs injected to the FPGA device have propagated to the output terminals of the device.

Published in:

Field-Programmable Technology (FPT), 2003. Proceedings. 2003 IEEE International Conference on

Date of Conference:

15-17 Dec. 2003