By Topic

Influence of automatic level control on micromechanical resonator oscillator phase noise

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Seungbae Lee ; Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA ; Nguyen, C.T.-C.

Clear differences in the phase noise performance of a 10 MHz MEMS-based micromechanical resonator oscillator have been measured using sustaining circuits with and without automatic-level control (ALC), and with differing mechanisms for ALC. In particular, low output power oscillators referenced to high-Q clamped-clamped beam μmechanical resonators exhibit an unexpected 1/f3 phase noise component without ALC, a 1/f5 phase noise component when an ALC circuit based on resonator dc-bias adjustment is used, and finally, removal of these components when an ALC circuit based on sustaining amplifier gain control is used, in which case the expected 1/f2 phase noise component is all that remains. That ALC is able to remove the 1/f3 phase noise seen in non-ALC'ed oscillators suggests that this noise component emanates primarily from nonlinearity in the voltage-to-force capacitive transducer, either through direct aliasing of amplifier 1/f noise, or through instabilities introduced by spring softening (i.e., Duffing) phenomena.

Published in:

Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International

Date of Conference:

4-8 May 2003