By Topic

Analyzing software measurement data with clustering techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shi Zhong ; Dept. of Comput. Sci., Florida Atlantic Univ., Boca Raton, FL, USA ; Khoshgoftaar, T.M. ; Seliya, N.

For software quality estimation, software development practitioners typically construct quality-classification or fault prediction models using software metrics and fault data from a previous system release or a similar software project. Engineers then use these models to predict the fault proneness of software modules in development. Software quality estimation using supervised-learning approaches is difficult without software fault measurement data from similar projects or earlier system releases. Cluster analysis with expert input is a viable unsupervised-learning solution for predicting software modules' fault proneness and potential noisy modules. Data analysts and software engineering experts can collaborate more closely to construct and collect more informative software metrics.

Published in:

Intelligent Systems, IEEE  (Volume:19 ,  Issue: 2 )