By Topic

Built-in test and diagnostics: two different approaches

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
R. Sallade ; Texas Instrum. Inc., Plano, TX, USA

The built-in test and embedded diagnostics for two subsystems of the M1A2 main battle tank, the commander's independent thermal viewer and the hull/turret electronics unit, are examined. Each of these systems supports the requirements for elimination of special test equipment at the tank level and the use of standard army test equipment for test and repair at higher echelons of maintenance. The tradeoffs made during system requirements analysis and flow-down, which led to two unique design implementations, are described. The advantages and disadvantages of each approach are discussed.<>

Published in:

IEEE Aerospace and Electronic Systems Magazine  (Volume:7 ,  Issue: 2 )