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Production deployment of a fast transient testing methodology for analog circuits: case study and results

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7 Author(s)
Voorakaranam, R. ; Texas Instruments Inc. ; Newby, R. ; Cherubal, S. ; Cometta, B.
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First Page of the Article

Published in:
Test Conference, 2003. Proceedings. ITC 2003. International  (Volume:1 )

Date of Conference: Sept. 30-Oct. 2, 2003

Page(s):
1174 - 1181
ISSN :
1089-3539
Print ISBN:
0-7803-8106-8
Digital Object Identifier :
10.1109/TEST.2003.1271106
Product Type:
Conference Publications

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