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It is well known that Meyer's model for the MOST implemented in SPICE does not guarantee charge conservation, while Ward's model seems somewhat complex to be used as a standard for the transient analysis of all the MOS circuits. In this work, a new simple MOST model for the transient analysis of MOS integrated circuits is presented. The model was developed by performing the numerical integration of the gate current as a first step without introducing the concept of a mean constant capacitance. The new model has been implemented in the program SGS-SPICE. All benchmark tests indicate that it conserves the charge at all the terminals of the MOS transistor.