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Statistical Integrated Circuit Design and Characterization

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3 Author(s)
Spoto, J.P. ; Harris Corporation, Semiconductor Sector, Melbourne, FL, USA ; Coston, W.T. ; Hernandez, C.Paul

A system for the parametric statistical characterization and design of integrated circuits (IC's) is presented. This system integrates many common CAD tools with in-house developed software, and is modular such that old tools can eventually be discarded and new ones installed without disruption. The system supports traditional Monte Carlo, as well as, approximate statistical methods, and spans the entire process, device, and circuit design spaces. Applications are included that demonstrate the many diverse ways the system has been exercised on real-world problems.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:5 ,  Issue: 1 )

Date of Publication:

January 1986

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