By Topic

Problems of Yield Gradient Estimation for Truncated Probability Density Functions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Styblinski, M.A. ; Department of Electrical Engineering, Texas A&M University, College Station, TX, USA

In this paper theoretical possibilities of statistical yield gradient estimation are discussed for those cases where circuit element probability density functions are truncated or nondifferantible, with a uniform distribution being a special case. With the yield gradient information available, the efficient derivative methods of yield optimization can be used. General derivative formulas are developed and their intuitive and geometric interpretations are given. Relationship between the yield derivatives and the marginal density functions of "pass" (or "fail") points is shown. Two possible algorithms for yield derivative estimation are discussed. The theory developed is also used to provide insight into some other methods of yield optimization.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:5 ,  Issue: 1 )