By Topic

An Extrapolated Yield Approximation Technique for Use in Yield Maximization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hocevar, D.E. ; Texas Instruments, Dallas, TX, USA ; Lightner, M.R. ; Trick, Timothy N.

This paper is concerned with the computational problem of maximizing the yield of circuits. A statistical Monte Carlo based approach is taken in order to compute yield estimates directly and to decrease dimensionality dependence. The main contribution of this paper is a yield extrapolation technique which is very effective in maximizing the yield along a search direction. This technique is based upon a quadratic model of the circuit. Statistical yield estimates are computed from the model and correlated sampling is used to extrapolate along the search direction. Two simple methods for determining search directions are discussed and these are used to demonstrate the overall method through several examples.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:3 ,  Issue: 4 )