Cart (Loading....) | Create Account
Close category search window
 

A Hierarchical Standard Cell Approach for Custom VLSI Design

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Tokuda, T. ; LSI Research Laboratory, Mitsubishi Electric Corporation, Itami, Japan ; Korematsu, J. ; Tomisawa, O. ; Asai, S.
more authors

A custom VLSI design technique, using an integrated CAD system is described. The design system features on the hierarchical design process and layout design capability by system designers (customers). As for application, high-performance LSI's for 16-bit CPU were developed. The LSI design was accomplished in a short period (three months with three designers) due to the hierarchical standard cell approach. The LSI chip contains about 20 K transistors in an 8.84 mm X 8.88 mm die area. High-speed operation (machine cycle = 200 ns) and a high density of 291 transistors/mm2 were obtained with low power consumption (1.2 W) owing to the mixed-MOS type standard cell library and this approach.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:3 ,  Issue: 3 )

Date of Publication:

July 1984

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.