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DC Statistical Circuit Analysis for Bipolar IC's Using Parameter Correlations-An Experimental Example

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1 Author(s)
Divekar, D.A. ; Zymos Corporation, Sunnyvale, CA, USA

Statistical analysis simulates circuit performance variations caused by tolerance variations and other circuit production factors. The procedure of statistical circuit simulation is illustrated with the help of a simple circuit example. Measurements are made on a sample of this circuit. These measured results are compared with the simulation results from worst-case and statistical analyses without and with model parameter correlations for the devices used in the circuit. The necessity for properly including the model parameter correlations is evident from this comparison.

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:3 ,  Issue: 1 )