Cart (Loading....) | Create Account
Close category search window
 

Corner Stitching: A Data-Structuring Technique for VLSI Layout Tools

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

Corner stitching is a technique for representing rectangular two-dimensional objects. It is especially well suited for interactive VLSI layout editing systems. The data structure has two important features: first, empty space is represented explicitly; and second, rectangular areas are stitched together at their corners like a patchwork quilt. This organization results in fast algorithms (linear or constant expected time) for searching, creation, deletion, stretching, and compaction. The algorithms are presented under a simplified model of VLSI circuits, and the storage requirements of the structure are discussed. Corner stitching has been implemented in a working layout editor. Initial measurements indicate that it requires about three times as much memory space as the simplest possible representation.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:3 ,  Issue: 1 )

Date of Publication:

January 1984

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.