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Neutron soft error rate measurements in a 90-nm CMOS process and scaling trends in SRAM from 0.25-/spl mu/m to 90-nm generation

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10 Author(s)
Hazucha, P. ; Intel Corp., Hillsboro, OR, USA ; Karnik, T. ; Maiz, J. ; Walstra, S.
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The neutron soft error rate (SER) dependency on voltage and area was measured for a state-of-the-art 90-nm CMOS technology. The SER increased by 18% for a 10% reduction in voltage, and scaled linearly with diode area. The measured SER per bit of SRAMs in 0.25 /spl mu/m, 0.18 /spl mu/m, 0.13 /spl mu/m, and 90 nm showed an increase of 8% per generation.

Published in:

Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International

Date of Conference:

8-10 Dec. 2003