Skip to Main Content
We investigate dynamic voltage scaling (DVS) in real-time embedded systems that use checkpointing for fault tolerance. We present feasibility-of-scheduling tests for checkpointing schemes for a constant processor speed as well as for variable processor speeds. DVS is then carried out on the basis of the feasibility analysis. We incorporate practical issues such as faults during checkpointing and state restoration, rollback recovery time, memory access time and energy, and DVS overhead. Simulation results are presented for real-life checkpointing data and embedded processors.