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Software-based self-test (SBST) strategies are particularly useful for periodic testing of deeply embedded processors in low-cost embedded systems that do not require immediate detection of errors and cannot afford the well-known hardware, software, or time redundancy mechanisms. In this paper, first, we identify the stringent characteristics of an SBST test program to be suitable for on-line periodic testing. Then, we introduce a new SBST methodology with a new classification scheme for processor components. After that, we analyze the self-test routine code styles for the three more effective test pattern generation (TPG) strategies in order to select the most effective self-test routine for on-line periodic testing of a component under test. Finally, we demonstrate the effectiveness of the proposed SBST methodology for on-line periodic testing by presenting experimental results for a RISC pipeline processor.
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings (Volume:1 )
Date of Conference: 16-20 Feb. 2004