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A convenient, iterative method for determining injection current generated two-dimensional carrier distributions, and consequent control of refractive index profiles, in optical guided-wave devices is presented. This method is "user-friendly" and readily adaptable to a large variety of materials and geometries. It is particularly useful for a quick and quite accurate assessment of the feasibility of operation of novel device structures. Results obtained by this quasianalytic method are shown to agree very favorably with those obtained from more general but far more complicated commercially available software.