Cart (Loading....) | Create Account
Close category search window
 

A generalized depth estimation algorithm with a single image

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shang-Hong Lai ; Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsin Chu, Taiwan ; Chang-Wu Fu ; Shyang Chang

A depth estimation algorithm proposed by A.P. Pentland (1987) is generalized. In the proposed algorithm, the raw image data in the vicinity of the edge is used to estimate the depth from defocus. Since no differentiation operation on the image data is required before the optimization process, the method is less sensitive to the noise disturbance of measurements. Furthermore, the edge orientation that was critical in Pentland's approach will not be required in the case. This algorithm is then applied to synthetic images containing various amounts of noise to test its performance. Experimental results indicate that the depth estimation errors are kept within 5% of true values on the average when it is applied to real images

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:14 ,  Issue: 4 )

Date of Publication:

Apr 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.