Close category search window
 

Feasibility of Lyapunov functions for power system transient stability analysis by the controlling UEP method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Eskicioglu, A.M. ; Middle East Tech. Univ., Ankara, Turkey ; Sevaioglu, O.

Recently a great deal of improvement has been achieved in reducing the inherent conservativeness of the direct method of Lyapunov in its application to the transient stability analysis of multimachine power systems. One major discovery is the recognition of the fault location as a critical factor for the determination of the boundary of the stability region. Three common Lyapunov functions are used in comparative evaluation to determine their feasibility for the local Lyapunov surface approach. It is shown that the performance of the chosen Lyapunov functions varies considerably in transient stability analysis. The accuracy in the estimates provided by each function, on the other hand, is understood to be rather different in various cases of instability occurring in power systems

Published in:
Generation, Transmission and Distribution, IEE Proceedings C  (Volume:139 ,  Issue: 2 )

Date of Publication: Mar 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.