By Topic

Electrooptic characterization of organic media

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Nahata, A. ; Allied-Signal, Inc., Morristown, NJ, USA ; Wu, C. ; Yardley, J.T.

The authors have developed an electrooptic characterization apparatus based on an AC-modulated Senarmont compensator. The apparatus is particularly suitable for studying the electrooptic response of thin polymer films. The system is capable of measuring the Pockel's effect at a variety of wavelengths with a minimum phase shift sensitivity of 1 μrad. Sample-to-sample variations in the coefficient measurements are less than 15%. The authors have made a systematic evaluation of thin, poled electrooptic polymer films on coplanar electrodes to demonstrate the usefulness of the apparatus. Corrections for the fringing effects of the applied electric field are described. The reproducibility of the electrooptic data through an examination of the polymer thickness dependence has been verified. The authors have also measured the poling field dependence of the electrooptic coefficient and obtained a best-fit molecular dipole value in excellent agreement with the reported value obtained from EFISH and solvatochromism measurements

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:41 ,  Issue: 1 )