Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Measuring the temperature dependence of resistivity of high purity copper using a solenoid coil (SRPM method)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

The resistivity of high purity copper was measured by a method which estimates it by using the difference in the impedance between a circular multilayer solenoid coil with a circular rod-shaped copper sample and a similar coil without a copper sample (SRPM method). The residual resistivity ratio (RRR) of high purity copper measured at 100 Hz by the SRPM method has correlated well with the values measured by the DC four-probe method. It was confirmed that an accurate measurement of the resistivity to 10-12 Ωm is possible by the SRPM method. Frequency dependence was confirmed to exist in high purity copper with very low resistivity. As the measuring frequency is raised, the decrease in skin depth seems to affect the resistivity

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:41 ,  Issue: 1 )