Cart (Loading....) | Create Account
Close category search window
 

Estimating degradation model parameters using neighborhood pattern distributions: an optimization approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kanungo, Tapas ; IBM Almanden Res. Center, San Jose, CA, USA ; Qigong Zheng

Noise models are crucial for designing image restoration algorithms, generating synthetic training data, and predicting algorithm performance. There are two related but distinct estimation scenarios. The first is model calibration, where it is assumed that the input ideal bitmap and the output of the degradation process are both known. The second is the general estimation problem, where only the image from the output of the degradation process is given. While researchers have addressed the problem of calibration of models, issues with the general estimation problems have not been addressed in the literature. In this paper, we describe a parameter estimation algorithm for a morphological, binary, page-level image degradation model. The inputs to the estimation algorithm are 1) the degraded image and 2) information regarding the font type (italic, bold, serif, sans serif). We simulate degraded images using our model and search for the optimal parameter by looking for a parameter value for which the local neighborhood pattern distributions in the simulated image and the given degraded image are most similar. The parameter space is searched using a direct search optimization algorithm. We use the p-value of the Kolmogorov-Smirnov test as the measure of similarity between the two neighborhood pattern distributions. We show results of our algorithm on degraded document images.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:26 ,  Issue: 4 )

Date of Publication:

April 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.