By Topic

High throughput high resolution Vortex™ detector for X-ray diffraction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Iwanczyk, J.S. ; Photon Imaging Inc., Northridge, CA, USA ; Patt, B.E. ; Barkan, S. ; Feng, L.
more authors

Vortex™ is a multicathode drift-type X-ray detector produced from high-purity silicon using state-of-the-art CMOS production technology . Based on the Vortex™ detector, we have developed a compact detector package for X-ray diffraction applications. The spectrometric package contains a 50 mm2 detector cooled using a small Peltier element. The detector package was interfaced with a digital pulse processor, and its performance was tested as a function of the input count rate and pulse peaking time. A pure Cu sample was irradiated with varying flux from an X-ray generator, and the output count rate and energy resolution were measured. The system was able to operate at very high rate (>1 Mcps) with virtually zero loss in resolution and no peak shift. Finally, the performance of the Vortex™ system was tested on a Philips (Model PW 1835) powder diffractometer, replacing the sealed tube proportional counter and the graphite monochromator with the silicon detector. The elimination of the graphite monochromator resulted in improvement of the detection efficiency by a factor of 2.5 and improvement in the detection limits due to the low background of the semiconductor detector.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:50 ,  Issue: 6 )