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Applicability of circuit macromodeling to analog single-event transient analysis

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3 Author(s)
Boulghassoul, Y. ; Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA ; Rowe, J.D. ; Massengill, L.W.

We have evaluated the applicability of vendor-supplied analog circuit macromodels to single-event transient (SET) analyses. Our findings demonstrate that macromodeling is very effective for system-level SET investigations; yet it is inadequate to address details of SET initiation at the IC level. Study of both dc and transient applications show that the circuitry peripheral to the ion strike location can be macromodeled and still retain an excellent ability to accurately transmit propagating voltage transients.

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Nuclear Science, IEEE Transactions on  (Volume:50 ,  Issue: 6 )