Referenced Items are not available for this document.
We describe an approach for analyzing single-event transients (SETs) in combinational circuits. The approach analyzes SETs via zero-delay simulation with the same accuracy of timing simulators, but with a speedup of three orders of magnitude.
Published in:
Nuclear Science, IEEE Transactions on
(Volume:50
,
Issue:
6
)
Date of Publication: Dec. 2003
- Page(s):
- 2113 - 2118
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 7942985
- Digital Object Identifier :
- 10.1109/TNS.2003.820729
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 February 2004
- Issue Date :
- Dec. 2003
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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