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Modeling single-event effects in a complex digital device

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7 Author(s)
K. A. Clark ; Naval Res. Lab., Washington, DC, USA ; A. A. Ross ; H. H. Loomis ; T. R. Weatherford
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A methodology to quantify the impact of SEEs on complex digital devices has been developed. This methodology is based on the SEE State-Transition Model and was validated by radiation testing of a complex digital device.

Published in:

IEEE Transactions on Nuclear Science  (Volume:50 ,  Issue: 6 )