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Comparison of CCD damage due to 10- and 60-MeV protons

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2 Author(s)
Hopkinson, G.R. ; Sira Electro-Opt. Ltd., Chislehurst, UK ; Mohammadzadeh, A.

Dark current and charge transfer inefficiency (CTI) data are presented for three charge-coupled devices (CCD) device types after 9.5- and 60-MeV proton irradiation. Comparison of the damage at the two energies allows a test of the validity of NIEL scaling. The ratio of the damage at 9.5 MeV to that at 60 MeV was found to be 35% higher for the CTI than for the average bulk dark current, for the devices tested. Both the CTI and the dark current showed significant annealing at 150°C, and this has implications for the lattice defects involved. Cobalt-60 data are also discussed.

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Nuclear Science, IEEE Transactions on  (Volume:50 ,  Issue: 6 )