By Topic

Application of an ultrafast photonic technique to study polarization switching dynamics of thin-film ferroelectric capacitors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Li, J. ; Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA ; Liang, H. ; Nagaraj, B. ; Cao, W.
more authors

We demonstrate the use of jitter-free ultrafast rise-time electrical pulses generated by a semiconductor photoconductive switch with femtosecond laser illumination to study the fast polarization switching process in fully integrated, ferroelectric PNZT thin-film capacitors. The necessary conditions for high-speed polarization switching detection are presented. The switching behavior for various sizes of capacitors and various rise-times of applied voltage pulses are investigated. Circuit influence on the activation field, α, as well as application of the Inshibashi-Merz model, are discussed.

Published in:

Lightwave Technology, Journal of  (Volume:21 ,  Issue: 12 )