By Topic

Scanning voltage microscopy on buried heterostructure multiquantum-well lasers: identification of a diode current leakage path

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Dayan Ban ; Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada ; Sargent, E.H. ; Dixon-Warren, St.J. ; Letal, G.
more authors

We report scanning voltage microscopy (SVM) results on actively driven buried heterostructure (BH) multiquantum-well (MQW) lasers that exhibit current blocking failure at high current injection operation. The measured two-dimensional image of local voltage distribution delineates the buried structures of the BH laser. The results, in combination with light-current-voltage (L-I-V) measurements, connect macroscopic external performance to measurements on the nanometer scale. Our experimental results suggest that the current blocking breakdown observed in the MQW BH lasers correlates with the turn-on of a diode leakage path when the devices are biased at high current injection.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:40 ,  Issue: 2 )