Referenced Items are not available for this document.
For today's large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. We offer an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.
Published in:
Design & Test of Computers, IEEE
(Volume:21
,
Issue:
1
)
Date of Publication: Jan-Feb 2004
- Page(s):
- 44 - 55
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 7949976
- Digital Object Identifier :
- 10.1109/MDT.2004.1261849
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 02 August 2004
- Issue Date :
- Jan-Feb 2004
- Sponsored by :
- IEEE Council on Electronic Design and Automation
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