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Seamless test of digital components in mixed-signal paths

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3 Author(s)
Ozev, S. ; Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA ; Bayraktaroglu, I. ; Orailoglu, A.

For today's large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. We offer an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.

Published in:

Design & Test of Computers, IEEE  (Volume:21 ,  Issue: 1 )

Date of Publication:

Jan-Feb 2004

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