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A built-in-self-test scheme for digital to analog converters

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2 Author(s)
Sunil Rafeeque, K.P. ; Dept. of Electr. Eng., Indian Inst. of Technol., Madras, India ; Vasudevan, V.

This paper describes a new Built-In-Self-Test(BIST) scheme for estimation of static non-linearity errors in digital to analog converters (DACs). The BIST scheme measures each transition and estimates non-linearity errors. It makes use of a sample and subtract circuit and a VCO. The circuit is designed using 0.35 μm CMOS technology from AMS. The simulation results are included in this paper. Errors estimated using the BIST scheme simulation match well with measured errors.

Published in:

VLSI Design, 2004. Proceedings. 17th International Conference on

Date of Conference:

2004