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A current sensor for on-chip, non-intrusive testing of RF systems

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4 Author(s)
Soldo, A. ; Dept. of Electr. Eng., Rochester Inst. of Technol., NY, USA ; Gopalan, A. ; Mukund, P.R. ; Margala, M.

This paper discusses design of a current sensor suitable for on-chip testing of RF circuits. The proposed sensor detects supply current (Idd) variations, with minimal impact on the circuit performance. Bandwidth of the circuit is 3.4 GHz, with a constant gain of 31.7 dB. The sensor has been implemented in IBM-6RF, 0.25 μ CMOS technology, with 2.5 V power supply and it offers the low real estate overhead and high dynamic range required for this application.

Published in:

VLSI Design, 2004. Proceedings. 17th International Conference on

Date of Conference:

2004

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