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With proliferation in wireless applications, RF circuitry is being included in a large number of Integrated Circuit (IC) designs. The testing of RF devices has become increasingly expensive due to the high cost of RF testers as well as the test times for RF circuits. The use of a new concurrent test methodology reduces RF test time by measuring multiple RF parameters in parallel using modulated RF stimuli. Experimental results on a GaAs Low-Noise Amplifier (LNA) are described.