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Embedded test for low cost manufacturing

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4 Author(s)
Rajski, J. ; Design Verification & Test Div., Mentor Graphics Corp., Wilsonville, OR, USA ; Tyszer, J. ; Mukherjee, N. ; Rinderknecht, T.

This paper presents state-of -the-art embedded test technology, practices, and automation tools for high-quality low cost manufacturing test. Embedded test structures are focused and pseudo random versus deterministic forms are compared. This paper covers new embedded test methodologies based on deterministic patterns, such as LFSR reseeding, OPMISR, Smart BIST, and embedded deterministic test.

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VLSI Design, 2004. Proceedings. 17th International Conference on

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