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Rapid amplitude and group-delay measurement system based on intra-cavity-modulated swept-lasers

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5 Author(s)
Set, S.Y. ; Alnair Labs. Corp., Saitama, Japan ; Jablonski, M.K. ; Hsu, K. ; Goh, C.S.
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In this paper, we present a high-speed wavelength-swept laser for application in a real-time optical device characterization system. The system is capable of simultaneous measurement of both the spectral amplitude and group-delay responses of the device-under-test, at a scan rate of 22 Hz over a wide wavelength range of 50 nm. This corresponds to a record sweep rate of >1000 nm/s.

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Instrumentation and Measurement, IEEE Transactions on  (Volume:53 ,  Issue: 1 )