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Modeling of thermal behavior in SOI structures

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4 Author(s)
Feixia Yu ; Dept. of Electr. & Comput. Eng., Clarkson Univ., Potsdam, NY, USA ; Cheng, M.-C. ; Habitz, P. ; Ahmadi, Goodarz

Several physics-based analytical steady-state heat flow models for silicon-on-insulator (SOI) devices are presented, offering approaches at different levels of accuracy and efficiency for prediction of temperature profiles induced by power dissipated in SOI MOSFETs. The approaches are verified with the rigorous device simulation based on the energy transport model coupled with the heat flow equation. The models describe the one-dimensional temperature profile in the silicon film of SOI structure and two-dimensional heat flow in FOX, accounting for heat loss to the substrate via BOX and FOX, heat loss to (or gain from) interconnects, and heat exchanges between devices. These models are applied to investigate thermal behavior in single SOI devices and two-device SOI structures.

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Electron Devices, IEEE Transactions on  (Volume:51 ,  Issue: 1 )