By Topic

Design and testing of SMA temperature-compensated cavity resonators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Keats, B.F. ; Electr. & Comput. Eng. Dept., Univ. of Waterloo, Ont., Canada ; Gorbet, R.B. ; Mansour, R.R.

In this paper, we present a method for designing temperature-compensated cavity resonators using shape memory alloys (SMAs). This paper gives an expression for the temperature drift of resonant frequency, which is valid for any conductor-loaded cavity regardless of its shape. This formula, combined with a field perturbation model, is used to derive the resonant frequency of an SMA-compensated resonator subject to temperature fluctuation. Experimental results are given that confirm the feasibility of the proposed design approach. A design method is proposed for specifying SMA alloys to build the actuator. An expression is derived to accurately predict the performance of an actuator design.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:51 ,  Issue: 12 )