Cart (Loading....) | Create Account
Close category search window

Optical characteristics of a self-aligned microlens fabricated on the sidewall of a 45°-angled optical fiber

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Jo, Kyoung-Woo ; Kwangju Inst. of Sci. & Technol., Gwangju, South Korea ; Myun-Sik Kim ; Lee, Jong Hyun ; Eun-Kyung Kim
more authors

We propose a self-aligned microlens fabricated on the sidewall of an optical fiber for a compact and high-throughput scanning optical microscopy (SNOM) application. The end face of the optical fiber is polished to have 45° for total internal reflection, and the microlens is fabricated on the sidewall of the optical fiber by exposing photoresist with ultraviolet light guided along the optical fiber. This method requires no active alignment and is compatible with standard photolithography. The microlens effectively focuses the illumination light emanating from the 45°-angled fiber, resulting in a beam radius of 1.1 μm at the focal length of 22.5 μm. When an SNOM probe has an aperture size of 143 nm and the input optical power to the SNOM probe is 400 μW, the optical throughput (the ratio of output to input power) is as high as 2.5×10-4, which is five times higher than without a microlens.

Published in:

Photonics Technology Letters, IEEE  (Volume:16 ,  Issue: 1 )

Date of Publication:

Jan. 2004

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.