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Statistical analysis and optimization of IC technology: program package for training and design via Internet/Intranet

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2 Author(s)
Nelayev, V.V. ; Stempitsky, V.R.

Program package for training and design via Internet/Intranet for statistical analysis and optimization of IC technology is presented in this paper.

Published in:
CAD Systems in Microelectronics, 2003. CADSM 2003. Proceedings of the 7th International Conference. The Experience of Designing and Application of

Date of Conference: 18-22 Feb. 2003

Print ISBN:
966-553-278-2
INSPEC Accession Number:
7845733
Digital Object Identifier :
10.1109/CADSM.2003.1255160

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