Close category search window
 

Space charge distribution before breakdown of polyimide film by short interval measurement with PEA method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)

We have been studying the breakdown characteristics of polyimide (PI) films. The purpose of this study is to clarify the effect of space charge and conduction current on breakdown mechanism of PI. The space charge distributions and external circuit current (lex) were simultaneously measured just before the breakdown of a 125 μm thick PI film by using pulsed electro-acoustic (PEA) method in 90°C. We tried to observe the change of space charge distribution just before the breakdown of PI films obtained by very short period interval (2 ms) measurement. The space charge distribution just before the breakdown did not show a noticeable change. These results showed that the breakdown of PI films is not directly caused by the distortion of the electric field before 2 ms at the breakdown, but is caused by a thermal breakdown process due to the conduction current by the temperature rise of sample. The simultaneous measurement of transient space charge profiles and lex must contribute to the investigation of conduction and breakdown phenomena of PI films.

Published in:
Electrical Insulation and Dielectric Phenomena, 2003. Annual Report. Conference on

Date of Conference: 19-22 Oct. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.