By Topic

RTL test pattern generation for high quality loosely deterministic BIST

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Santos, M.B. ; IST / INESC-M, Lisboa, Portugal ; Fernandes, J.M. ; Teixeira, I.C. ; Teixeira, J.P.

High quality Built-In Self Test (BIST) needs to efficiently tackle the coverage of random-pattern-resistant (r.p.r) defects. Several techniques have been proposed to cover r.p.r faults at logic level, namely, weighted pseudo-random and mixed-mode. In mixed-mode test pattern generation (TPG) techniques, deterministic tests are added to pseudorandom vectors to detect r.p.r. faults. Recently, a RTL mixed-mode TPG technique has been proposed to cover r.p.r defects, the mask-based BIST technique. The purpose of this paper is to present mask-based BIST TPG improvements, namely in two areas: RTL estimation of the test length to be used for each mask in order to reach high Defects Coverage (DC), and the identification of an optimum mask for each set of nested RTL conditions. Results are used to predict the number of customized vectors for each mask of one ITC'99 benchmark module.

Published in:

Design, Automation and Test in Europe Conference and Exhibition, 2003

Date of Conference:

2003