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Versatile high-level synthesis of self-checking datapaths using an on-line testability metric

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3 Author(s)
P. Oikonomakos ; Dept. of Electron. & Comput. Sci., Southampton Univ., UK ; M. Zwolinski ; B. M. Al-Hashimi

There have been several recent attempts to include duplication-based on-line testability in behaviourally synthesized designs. In this paper, on-line testability is considered within the optimisation process of iterative, cost function-driven high-level synthesis, such that on-line testing resources are inserted automatically without any modification of the source HDL code. This involves the introduction of a metric for on-line testability. A variation of duplication testing (namely inversion testing) is also used, providing the system with an additional degree of freedom towards minimising hardware overheads associated with test resource insertion. Considering on-line testability within the synthesis process facilitates fast and efficient design space exploration, resulting in a versatile high-level synthesis process, capable of producing alternative realisations according to the designer's directions.

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Design, Automation and Test in Europe Conference and Exhibition, 2003

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