By Topic

Optimal reconfiguration functions for column or data-bit built-in self-repair

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Nicolaidis, M. ; iRoC Technol., Grenoble, France ; Achouri, N. ; Boutobza, S.

In modern SoCs, embedded memories occupy the largest part of the chip area and include an even larger amount of active devices. As memories are designed very tightly to the limits of the technology, they are more prone to failures than logic. Thus, memories concentrate the large majority of defects and affect circuit yield dramatically. Hence, built-in self-repair is gaining importance. This work presents optimal reconfiguration functions for memory built-in self-repair on the data-bit level. We also present a dynamic repair scheme that allows a reduction of the size of the repairable units. The combination of these schemes allows repairing multiple faults affecting both regular and spare units, by means of low hardware cost. The scheme uses a single test pass, resulting on low test and repair time.

Published in:

Design, Automation and Test in Europe Conference and Exhibition, 2003

Date of Conference:

2003