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Time-resolved emission testing challenges for low voltage CMOS technologies

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3 Author(s)
Song, P. ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA ; Stellari, F. ; Mc Manus, M.K.

The advances of CMOS technologies have challenged the time-resolved emission testing and diagnostics of certain applications. This paper addresses these challenges from both emission tooling and chip design perspective.

Published in:

Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE  (Volume:2 )

Date of Conference:

27-28 Oct. 2003