By Topic

Performance analysis of a 0.3-Tb/in2 low-power MFM-based scanning-probe device

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
El-Sayed, R.T. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Carley, L.R.

In this paper, we present an analysis of the performance of a 0.3-Tb/in2 ultralow-power magnetic-force-microscopy-based scanning-probe storage device actuated by microelectromechanical systems technology. The device is currently under development at Carnegie Mellon University, Pittsburgh, PA. The analysis shows that, with an optimized commercial single-layered Co-based perpendicular medium with an optimized tip trajectory, a signal-to-noise ratio of 20-25 dB is achievable. The analysis includes general design considerations as well as various aspects of performance such as recording dynamics, PW50, intersymbol-interference limit, detection sensitivity, thermal degradation, intertrack interference, off-track errors, process variations, and surface fluctuation effect. Design/performance standards for the new device are suggested.

Published in:

Magnetics, IEEE Transactions on  (Volume:39 ,  Issue: 6 )