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Initial characterization of new coherent soft X-ray branchline at the advanced light source

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7 Author(s)
K. Rosfjord ; Center for X-ray Opt., Lawrence Berkeley Nat. Lab., CA, USA ; P. Denham ; C. Kemp ; E. Gullikson
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This study presents preliminary operation of a new coherent soft X-ray branchline at the advanced light source. This branch delivers spectrally and spatially coherent soft X-rays ranging from 200 eV to 1 keV photon energies (6.2 nm to 1.2 nm wavelength) using the third harmonic from an 8 cm period undulator. The increased energy range will allow interferometric techniques to be used in the extreme ultraviolet region to the soft X-ray region.

Published in:

Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE  (Volume:1 )

Date of Conference:

27-28 Oct. 2003